List of Services
Below, you’ll find descriptions of some of the techniques provided by Jordi Labs. If you don’t see a technique that you’re interested in, contact us. We frequently add new techniques to our portfolio. We can help with most any analytical problem.
Capillary Rheometry
Measures apparent viscosity (resistance to flow) over a broad range of shear rates and at varied temperatures, which are comparable to the conditions encountered in molding, calendaring, extrusion, etc. The data is commonly used to determine processing parameters, for lot-to-lot quality control, to measure processing degradation, which could reduce physical properties, and to study thermal stability.
According to customer specifications, temperature, shear rate and other parameters are selected. In a Shear Sweep melted plastic is extruded through a capillary and the force at varied shear rates is determined. To determine Thermal Stability, melted plastic is extruded through a capillary after varied periods of residence time in the barrel of the extruder. (Read more)
Electron Spectroscopy for Chemical Analysis (ESCA)
X-Ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a surface analysis technique used for obtaining chemical information about the surfaces of solid materials. Insulators and conductors can easily be analyzed from areas a few microns and larger. The method utilizes an x-ray beam to excite a solid sample resulting in the emission of photoelectrons. An energy analysis of these photoelectrons provides both elemental and chemical bonding information about the material comprising the sample surface. All elements, except hydrogen and helium can be detected.
In XPS analysis, the sample is placed in an ultrahigh vacuum environment and exposed to a low-energy, monochromatic X-ray source, x-ray excitation causes the emission of photoelectrons from the atomic shells of the elements present on the surface. The energy of these electrons is characteristic of the element from which they are emitted. By counting the number of electrons as a function of energy, a spectrum representative of the surface composition is obtained. The area under peaks in the spectrum is a measure of the relative amount of each element present, and the shape and position of the peaks reflect the chemical state for each element.
XPS is a surface sensitive technique because only those photoelectrons generated near the surface can escape and become available for detection. Due to collisions within the sample’s atomic structure, those photoelectrons originating much more than about 20 to 100 Å below the surface are unable to escape from the surface with sufficient energy to be detected.